Influence of C60 co-deposition on the growth kinetics of diindenoperylene-From rapid roughening to layer-by-layer growth in blended organic films

C Lorch; J Novák; R Banerjee; S Weimer; J Dieterle; C Frank; A Hinderhofer; A Gerlach; F Carla; F Schreiber

doi:10.1063/1.4966583

Influence of C₆₀ co-deposition on the growth kinetics of diindenoperylene-From rapid roughening to layer-by-layer growth in blended organic films

J Chem Phys. 2017 Feb 7;146(5):052807. doi: 10.1063/1.4966583.

Authors

C Lorch¹, J Novák¹, R Banerjee¹, S Weimer¹, J Dieterle¹, C Frank¹, A Hinderhofer¹, A Gerlach¹, F Carla², F Schreiber¹

Affiliations

¹ Universität Tübingen, Institut für Angewandte Physik, Auf der Morgenstelle 10, 72076 Tübingen, Germany.
² ESRF-The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble, France.

PMID: 28178831
DOI: 10.1063/1.4966583

Abstract

We investigated the growth of the two phase-separating materials diindenoperylene (DIP) and buckminsterfullerene C₆₀ with different mixing ratio in real-time and in situ by X-ray scattering experiments. We found that at room temperature, mixtures with an excess of DIP show a growth mode which is very close to the perfect layer-by-layer limit with DIP crystallites forming over the entire film thickness. An unexpected increase in the island size is observed for these mixtures as a function of film thickness. On the other hand, equimolar and C₆₀ dominated mixtures grow with poor crystallinity but form very smooth films. Additionally, it is observed that higher substrate temperatures lead to an increase in the length scale of phase separation with film thickness.