Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm

Thanh Hung Dinh; Yoshiki Kondo; Toshiki Tamura; Yuichi Ono; Hiroyuki Hara; Hiroki Oikawa; Yoichi Yamamoto; Masahiko Ishino; Masaharu Nishikino; Tetsuya Makimura; Padraig Dunne; Gerry O'Sullivan; Shigeru Ohta; Ken Kitano; Takeo Ejima; Tadashi Hatano; Takeshi Higashiguchi

doi:10.1063/1.4971421

Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm

Rev Sci Instrum. 2016 Dec;87(12):123106. doi: 10.1063/1.4971421.

Authors

Thanh Hung Dinh¹, Yoshiki Kondo¹, Toshiki Tamura¹, Yuichi Ono¹, Hiroyuki Hara¹, Hiroki Oikawa¹, Yoichi Yamamoto², Masahiko Ishino², Masaharu Nishikino², Tetsuya Makimura³, Padraig Dunne⁴, Gerry O'Sullivan⁴, Shigeru Ohta⁵, Ken Kitano⁵, Takeo Ejima⁶, Tadashi Hatano⁶, Takeshi Higashiguchi¹

Affiliations

¹ Department of Electrical and Electronic Engineering, Faculty of Engineering and Center for Optical Research and Education (CORE), Utsunomiya University, 7-1-2 Yoto, Utsunomiya, Tochigi 321-8585, Japan.
² Kansai Photon Science Institute, National Institutes for Quantum and Radiological Science and Technology (QST), 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215, Japan.
³ Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan.
⁴ School of Physics, University College Dublin, Belfield, Dublin 4, Ireland.
⁵ Vacuum and Optical Instruments, 2-18-18 Shimomaruko, Ohta-ku, Tokyo 146-0092, Japan.
⁶ Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan.

PMID: 28040919
DOI: 10.1063/1.4971421

Abstract

A flat-field grazing incidence spectrometer operating on the spectral region from 1 to 10 nm was built for research on physics of high temperature and high energy density plasmas. It consists of a flat-field grating with 2400 lines/mm as a dispersing element and an x-ray charged coupled device (CCD) camera as the detector. The diffraction efficiency of the grating and the sensitivity of the CCD camera were directly measured by use of synchrotron radiation at the BL-11D beamline of the Photon Factory (PF). The influence of contamination to the spectrometer also was characterized. This result enables us to evaluate the absolute number of photons in a wide range wavelength between 1 and 10 nm within an acquisition. We obtained absolutely calibrated spectra from highly charged ion plasmas of Gd, from which a maximum energy conversion efficiency of 0.26% was observed at a Nd:YAG laser intensity of 3 × 10¹² W/cm².