A Supercritical Lens Optical Label-Free Microscopy: Sub-Diffraction Resolution and Ultra-Long Working Distance

Fei Qin; Kun Huang; Jianfeng Wu; Jinghua Teng; Cheng-Wei Qiu; Minghui Hong

doi:10.1002/adma.201602721

A Supercritical Lens Optical Label-Free Microscopy: Sub-Diffraction Resolution and Ultra-Long Working Distance

Adv Mater. 2017 Feb;29(8). doi: 10.1002/adma.201602721. Epub 2016 Dec 19.

Authors

Fei Qin¹, Kun Huang², Jianfeng Wu^{1

3}, Jinghua Teng², Cheng-Wei Qiu¹, Minghui Hong¹

Affiliations

¹ Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore, 117583, Singapore.
² Institute of Materials Research and Engineering, Agency for Science Technology and Research (A*STAR), 2 Fusionopolis Way, Innovis, #08-03, Singapore, 138634, Singapore.
³ Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore, 117542, Singapore.

PMID: 27991699
DOI: 10.1002/adma.201602721

Abstract

A planar metalens for achieving super-resolution imaging in far-field is proposed. This metalens, which has a non-sub-wavelength feature size, can be fabricated by conventional laser pattern generator. The imaging process is purely physical and captured in real time, without any pre- and post-processing.

Keywords: far-field; label-free; optical imaging; planar lens; super-resolution.