A new setup for high resolution fast X-ray reflectivity data acquisition

Milena Lippmann; Adeline Buffet; Kathrin Pflaum; Anita Ehnes; Anca Ciobanu; Oliver H Seeck

doi:10.1063/1.4967239

A new setup for high resolution fast X-ray reflectivity data acquisition

Rev Sci Instrum. 2016 Nov;87(11):113904. doi: 10.1063/1.4967239.

Authors

Milena Lippmann¹, Adeline Buffet¹, Kathrin Pflaum², Anita Ehnes¹, Anca Ciobanu¹, Oliver H Seeck¹

Affiliations

¹ Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany.
² Max-Planck-Institute for Solid State Research, Heisenbergstraße 1, 70569 Stuttgart, Germany.

PMID: 27910596
DOI: 10.1063/1.4967239

Abstract

A new method for fast x-ray reflectivity data acquisition is presented. The method is based on a fast rotating, slightly tilted sample reflecting to a stationary mounted position sensitive detector and it allows for measurements of reflectivity curves in a quarter of a second. The resolution in q-space mainly depends on the beam properties and the pixel size of the detector. Maximum q_z-value of 1 Å^-1 can be achieved. The time-temperature depending structure changes of poly(N-isopropylacrylamide) thin films were investigated in situ by applying the fast-reflectivity setup. The results are presented in this paper as illustration of the method and proof of principle.