Note: Wide-range and high-resolution on-chip delay measurement circuit with low supply-voltage sensitivity for SoC applications

Duo Sheng; Yu-Chan Hung

doi:10.1063/1.4968533

Note: Wide-range and high-resolution on-chip delay measurement circuit with low supply-voltage sensitivity for SoC applications

Rev Sci Instrum. 2016 Nov;87(11):116101. doi: 10.1063/1.4968533.

Authors

Duo Sheng¹, Yu-Chan Hung¹

Affiliation

¹ Department of Electrical Engineering, Fu Jen Catholic University, New Taipei City, 24205 Taiwan.

PMID: 27910432
DOI: 10.1063/1.4968533

Abstract

This paper presents an on-chip delay measurement (OCDM) circuit with a wide delay-measurement range, a high delay-measurement resolution and low supply-voltage sensitivity for efficient detection, and diagnosis in the high-performance system-on-chip (SoC). The proposed cascade-stage measurement structure can simultaneously achieve a delay-measurement range of several nanoseconds and a quantization resolution of several picoseconds. The proposed delay-measurement circuit has a high immunity to supply voltage variations without any additional calibration or self-biasing circuit. The delay-measurement range is 5.25 ns with 6 ps resolution; and the average delay resolution variation is 0.41% with ±10% supply voltage variations.