A method to characterize the roughness of 2-D line features: recrystallization boundaries

J Sun; Y B Zhang; A B Dahl; K Conradsen; D Juul Jensen

doi:10.1111/jmi.12501

A method to characterize the roughness of 2-D line features: recrystallization boundaries

J Microsc. 2017 Mar;265(3):313-321. doi: 10.1111/jmi.12501. Epub 2016 Nov 29.

Authors

J Sun¹, Y B Zhang¹, A B Dahl², K Conradsen², D Juul Jensen¹

Affiliations

¹ Section for Materials Science and Advanced Characterization, Department of Wind Energy, Technical University of Denmark, Risø Campus, Roskilde, Denmark.
² Section for Image Analysis and Computer Graphics, Department of Applied Mathematics and Computer Science, Technical University of Denmark, Lyngby, Denmark.

PMID: 27896802
DOI: 10.1111/jmi.12501

Abstract

A method is presented, which allows quantification of the roughness of nonplanar boundaries of objects for which the neutral plane is not known. The method provides quantitative descriptions of both the local and global characteristics. How the method can be used to estimate the sizes of rough features and local curvatures is also presented. The potential of the method is illustrated by quantification of the roughness of two recrystallization boundaries in a pure Al specimen characterized by scanning electron microscopy.

Keywords: Area integral invariant; boundary; curvature; electron backscatter diffraction; recrystallization; roughness.

Publication types

Research Support, Non-U.S. Gov't