X-ray diffraction measurements in high magnetic fields and at high temperatures

Yoshifuru Mitsui; Keiichi Koyama; Kazuo Watanabe

doi:10.1088/1468-6996/10/1/014612

X-ray diffraction measurements in high magnetic fields and at high temperatures

Sci Technol Adv Mater. 2009 May 22;10(1):014612. doi: 10.1088/1468-6996/10/1/014612. eCollection 2009 Feb.

Authors

Yoshifuru Mitsui¹, Keiichi Koyama¹, Kazuo Watanabe¹

Affiliation

¹ High Field Laboratory for Superconducting Materials, Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, 980-8577, Japan.

Abstract

A system was developed measuring x-ray powder diffraction in high magnetic fields up to 5 T and at temperatures from 283 to 473 K. The stability of the temperature is within 1 K over 6 h. In order to examine the ability of the system, the high-field x-ray diffraction measurements were carried out for Si and a Ni-based ferromagnetic shape-memory alloy. The results show that the x-ray powder diffraction measurements in high magnetic fields and at high temperatures are useful for materials research.

Keywords: high temperature; magnetic field; shape-memory alloy; x-ray diffraction.