Demonstration of Single-Shot Picosecond Time-Resolved MeV Electron Imaging Using a Compact Permanent Magnet Quadrupole Based Lens

D Cesar; J Maxson; P Musumeci; Y Sun; J Harrison; P Frigola; F H O'Shea; H To; D Alesini; R K Li

doi:10.1103/PhysRevLett.117.024801

Demonstration of Single-Shot Picosecond Time-Resolved MeV Electron Imaging Using a Compact Permanent Magnet Quadrupole Based Lens

Phys Rev Lett. 2016 Jul 8;117(2):024801. doi: 10.1103/PhysRevLett.117.024801. Epub 2016 Jul 7.

Authors

D Cesar¹, J Maxson¹, P Musumeci¹, Y Sun¹, J Harrison², P Frigola³, F H O'Shea³, H To³, D Alesini⁴, R K Li⁵

Affiliations

¹ Department of Physics and Astronomy, UCLA, Los Angeles, California 90095, USA.
² Department of Electrical Engineering, UCLA, Los Angeles, California 90095, USA.
³ RadiaBeam Technologies, 1717 Stewart Street, Santa Monica, California 90404, USA.
⁴ INFN-LNF, Via E. Fermi, 40-00044 Frascati, Rome, Italy.
⁵ SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA.

PMID: 27447510
DOI: 10.1103/PhysRevLett.117.024801

Abstract

We present the results of an experiment where a short focal length (∼1.3 cm), permanent magnet electron lens is used to image micron-size features (of a metal sample) with a single shot from an ultrahigh brightness picosecond-long 4 MeV electron beam emitted by a radio-frequency photoinjector. Magnification ratios in excess of 30× were obtained using a triplet of compact, small gap (3.5 mm), Halbach-style permanent magnet quadrupoles with nearly 600 T/m field gradients. These results pave the way towards single-shot time-resolved electron microscopy and open new opportunities in the applications of high brightness electron beams.