An algorithm, based on the wavelet scalogram energy, for automatically detecting events in force-extension AFM force spectroscopy experiments is introduced. The events to be detected are characterized by a discontinuity in the signal. It is shown how the wavelet scalogram energy has different decay rates at different points depending on the degree of regularity of the signal, showing faster decay rates at regular points and slower rates at singular points (jumps). It is shown that these differences produce peaks in the scalogram energy plot at the event points. Finally, the algorithm is illustrated in a tether analysis experiment by using it for the detection of events in the AFM force-extension curves susceptible to being considered tethers. Microsc. Res. Tech. 80:153-159, 2017. © 2016 Wiley Periodicals, Inc.
Keywords: atomic force microscopy; automatic event detection; batch processing; tether detection; wavelet analysis.
© 2016 Wiley Periodicals, Inc.