Measurement of the thermoelectric power factor of films over the 10-400 K range

Mohammad Abir Hossain; Seyedhamidreza Alaie; Mehran Tehrani

doi:10.1063/1.4946997

Measurement of the thermoelectric power factor of films over the 10-400 K range

Rev Sci Instrum. 2016 Apr;87(4):045111. doi: 10.1063/1.4946997.

Authors

Mohammad Abir Hossain¹, Seyedhamidreza Alaie², Mehran Tehrani¹

Affiliations

¹ Advanced Structural and Energy Materials Laboratory, Department of Mechanical Engineering, University of New Mexico, Albuquerque, New Mexico 87131, USA.
² Department of Radiology, Weill Cornell Medicine, New York, New York 10021, USA.

PMID: 27131711
DOI: 10.1063/1.4946997

Abstract

The design and development of a novel apparatus for the simultaneous measurement of electrical resistivity and Seebeck coefficient of films is reported here. Mounting stage is integrated inside a cryostat chamber enabling measurements over the 10-400 K temperature range, intended for organic thermoelectrics. Finite element method was used to analyze the thermo-mechanical response of the sample holder. The apparatus was validated against high purity nickel film, and a very good agreement was found.