Optical-Fiber Power Meter Comparison between NIST and KRISS

I Vayshenker; S K Kim; K Hong; D-H Lee; D J Livigni; X Li; J H Lehman

doi:10.6028/jres.117.019

Optical-Fiber Power Meter Comparison between NIST and KRISS

J Res Natl Inst Stand Technol. 2012 Dec 21:117:328-32. doi: 10.6028/jres.117.019. eCollection 2012.

Authors

I Vayshenker¹, S K Kim², K Hong², D-H Lee², D J Livigni¹, X Li¹, J H Lehman¹

Affiliations

¹ National Institute of Standards and Technology, Boulder, CO 80305, USA.
² Center for Photometry and Radiometry, Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon 305-340, Republic of Korea.

Abstract

We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Korea Research Institute of Standards and Science (KRISS-R.O. Korea) for optical fiber-based power measurements at wavelengths of 1302 nm and 1546 nm. We compare the laboratories' reference standards by means of a temperature-controlled optical trap detector. Measurement results showed the largest difference of less than 2.5 parts in 10(3), which is within the combined standard (k=1) uncertainty for the two laboratories' reference standards.

Keywords: international comparison; optical fiber; optical power.