Effects of Contact-Induced Doping on the Behaviors of Organic Photovoltaic Devices

Nano Lett. 2015 Nov 11;15(11):7627-32. doi: 10.1021/acs.nanolett.5b03473. Epub 2015 Oct 14.

Abstract

Substrates can significantly affect the electronic properties of organic semiconductors. In this paper, we report the effects of contact-induced doping, arising from charge transfer between a high work function hole extraction layer (HEL) and the organic active layer, on organic photovoltaic device performance. Employing a high work function HEL is found to increase doping in the active layer and decrease photocurrent. Combined experimental and modeling investigations reveal that higher doping increases polaron-exciton quenching and carrier recombination within the field-free region. Consequently, there exists an optimal HEL work function that enables a large built-in field while keeping the active layer doping low. This value is found to be ~0.4 eV larger than the pinning level of the active layer material. These understandings establish a criterion for optimal design of the HEL when adapting a new active layer system and can shed light on optimizing performance in other organic electronic devices.

Keywords: Fermi level pinning; capacitance−voltage; charge transfer; polaron−exciton quenching; recombination.