Spatio-TEmporally REsolved Optical Laser Induced Damage (STEREO LID) technique for material characterization

Opt Express. 2015 Aug 24;23(17):21607-14. doi: 10.1364/OE.23.021607.

Abstract

A technique for measuring the ablation and laser-induced damage threshold (LIDT) by identifying the temporal onset of damage and location of initiation within the beam profile is demonstrated. This new method, dubbed Spatio-TEmporally REsolved Optical Laser Induced Damage (STEREO LID), is compared to traditional damage tests and its advantages are exemplified.