One-Nanometer Thin Monolayers Remove the Deleterious Effect of Substrate Defects in Molecular Tunnel Junctions

Nano Lett. 2015 Oct 14;15(10):6643-9. doi: 10.1021/acs.nanolett.5b02481. Epub 2015 Sep 9.

Abstract

Defects in self-assembled monolayer (SAMs) based junctions cause the largest deviation between predicted and measured values of the tunnelling current. We report the remarkable, seemingly counterintuitive finding that shorter, less-ordered SAMs provide, unlike taller crystalline-like SAMs, higher quality tunnelling barriers on defective substrates, which points to self-repair of liquid-like SAMs on defects. The molecular dynamics show that short-chain molecules can more easily rotate into low-density boundary regions and smoothen out defects than thick solid-like SAMs. Our findings point to an attractive means of removing their deleterious effects simply by using flexible molecules.

Keywords: EGaIn junctions; Molecular electronics; defects; self-assembled monolayers; self-repair.

Publication types

  • Research Support, Non-U.S. Gov't