A sub-micrometer resolution hard X-ray microprobe system of BL8C at Pohang Light Source

Nark Eon Sung; Ik Jae Lee; Kug Seong Lee; Seong Hun Jeong; Seen Woong Kang; Yong Bi Shin

doi:10.1107/S1600577515014071

A sub-micrometer resolution hard X-ray microprobe system of BL8C at Pohang Light Source

J Synchrotron Radiat. 2015 Sep;22(5):1306-11. doi: 10.1107/S1600577515014071. Epub 2015 Aug 4.

Authors

Nark Eon Sung¹, Ik Jae Lee¹, Kug Seong Lee¹, Seong Hun Jeong¹, Seen Woong Kang¹, Yong Bi Shin²

Affiliations

¹ Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang 790-784, South Korea.
² Gyeongju National Museum, Gyeongju 780-150, South Korea.

PMID: 26289285
DOI: 10.1107/S1600577515014071

Abstract

A microprobe system has been installed on the nanoprobe/XAFS beamline (BL8C) at PLS-II, South Korea. Owing to the reproducible switch of the gap of the in-vacuum undulator (IVU), the intense and brilliant hard X-ray beam of an IVU can be used in X-ray fluorescence (XRF) and X-ray absorption fine-structure (XAFS) experiments. For high-spatial-resolution microprobe experiments a Kirkpatrick-Baez mirror system has been used to focus the millimeter-sized X-ray beam to a micrometer-sized beam. The performance of this system was examined by a combination of micro-XRF imaging and micro-XAFS of a beetle wing. These results indicate that the microprobe system of the BL8C can be used to obtain the distributions of trace elements and chemical and structural information of complex materials.

Keywords: X-ray instrumentation; XAFS; micro-XANES; micro-XRF; microprobe.

Publication types

Research Support, Non-U.S. Gov't