We employed nanobeam X-ray diffraction using an X-ray spot size of 150 nm to investigate the local structure of P3HT thin films. We derived nanoscale real space maps of the X-ray diffraction properties at the π-π (020) diffraction peak. The X-ray data reveal a complex nanoscale structure of the polymer network with strong local variation where some areas of the film display a rather high degree of angular order. We quantify both the magnitude and direction of the angular order. Our results provide new insights into the local structural properties and connectivity of P3HT films.
Keywords: XCCA; conductive polymers; local symmetries and interconnectivity; nanoscale structural properties.