Erratum: An X-ray diffractometer using mirage diffraction. Erratum

Tomoe Fukamachi; Sukswat Jongsukswat; Dongying Ju; Riichirou Negishi; Keiichi Hirano; Takaaki Kawamura

doi:10.1107/S1600576714026028

Erratum: An X-ray diffractometer using mirage diffraction. Erratum

J Appl Crystallogr. 2015 Jan 30;48(Pt 1):312. doi: 10.1107/S1600576714026028. eCollection 2015 Feb 1.

Authors

Tomoe Fukamachi¹, Sukswat Jongsukswat¹, Dongying Ju¹, Riichirou Negishi¹, Keiichi Hirano², Takaaki Kawamura³

Affiliations

¹ Saitama Institute of Technology , Fukaya, Saitama 369-0293, Japan.
² Institute of Material Structure Science, KEK-PF, High Energy Accelerator Research Organization , Tsukuba, Ibaraki 305-0801, Japan.
³ University of Yamanashi , Kofu 400-8510, Japan.

Abstract

Errors in the article by Fukamachi, Jongsukswat, Ju, Negishi, Hirano & Kawamura [J. Appl. Cryst. (2014), 47, 1267-1272] are corrected.[This corrects the article DOI: 10.1107/S1600576714012114.].

Keywords: X-ray difractometers; dynamical theory of X-ray diffraction; interference fringes; mirage diffraction; mirage fringes; monochromators.

Publication types

Published Erratum