Origin and compensation of imaging artefacts in localization-based super-resolution microscopy

M Erdélyi; J Sinkó; R Kákonyi; A Kelemen; E Rees; D Varga; G Szabó

doi:10.1016/j.ymeth.2015.05.025

Origin and compensation of imaging artefacts in localization-based super-resolution microscopy

Methods. 2015 Oct 15:88:122-32. doi: 10.1016/j.ymeth.2015.05.025. Epub 2015 May 31.

Authors

M Erdélyi¹, J Sinkó², R Kákonyi², A Kelemen³, E Rees⁴, D Varga², G Szabó²

Affiliations

¹ Department of Optics and Quantum Electronics, University of Szeged, Szeged, Dóm tér 9, 6720, Hungary. Electronic address: erdelyim@physx.u-szeged.hu.
² Department of Optics and Quantum Electronics, University of Szeged, Szeged, Dóm tér 9, 6720, Hungary.
³ Department of Applied Informatics, University of Szeged, Boldogasszony sgt. 6, 6725, Hungary.
⁴ Department of Chemical Engineering and Biotechnology, University of Cambridge, New Museums Site, Pembroke Street, Cambridge CB2 3RA, UK.

PMID: 26036838
DOI: 10.1016/j.ymeth.2015.05.025

Abstract

Interpretation of high resolution images provided by localization-based microscopy techniques is a challenge due to imaging artefacts that can be categorized by their origin. They can be introduced by the optical system, by the studied sample or by the applied algorithms. Some artefacts can be eliminated via precise calibration procedures, others can be reduced only below a certain value. Images studied both theoretically and experimentally are qualified either by pattern specific metrics or by a more general metric based on fluorescence correlation spectroscopy.

Keywords: Imaging artefacts; Localization error; Localization microscopy; Super-resolution microscopy.

Publication types

Research Support, Non-U.S. Gov't

MeSH terms

Algorithms
Artifacts*
Calibration
Microscopy, Fluorescence / methods*