Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopy

Ultramicroscopy. 2015 Oct:157:21-6. doi: 10.1016/j.ultramic.2015.05.010. Epub 2015 May 14.

Abstract

We demonstrate absolute scale agreement between the number of X-ray counts in energy dispersive X-ray spectroscopy using an atomic-scale coherent electron probe and first-principles simulations. Scan-averaged spectra were collected across a range of thicknesses with precisely determined and controlled microscope parameters. Ionization cross-sections were calculated using the quantum excitation of phonons model, incorporating dynamical (multiple) electron scattering, which is seen to be important even for very thin specimens.

Keywords: Energy dispersive X-ray (EDX) spectroscopy; Scanning transmission electron microscopy (STEM).

Publication types

  • Research Support, Non-U.S. Gov't