Note: Determining the detection efficiency of excited neutral atoms by a microchannel plate detector

Rev Sci Instrum. 2015 Apr;86(4):046103. doi: 10.1063/1.4916953.

Abstract

We present a method for determining the detection efficiency of neutral atoms relative to keV ions. Excited D* atoms are produced by D2 fragmentation in a strong laser field. The fragments are detected by a micro-channel plate detector either directly as neutrals or as keV ions following field ionization and acceleration by a static electric field. Moreover, we propose a new mechanism by which neutrals are detected. We show that the ratio of the yield of neutrals and ions can be related to the relative detection efficiency of these species.