Corrigendum: Dark-field X-ray microscopy for multiscale structural characterization
Nat Commun
.
2015 Mar 5:6:6612.
doi: 10.1038/ncomms7612.
Authors
H Simons
,
A King
,
W Ludwig
,
C Detlefs
,
W Pantleon
,
S Schmidt
,
F Stöhr
,
I Snigireva
,
A Snigirev
,
H F Poulsen
PMID:
25739984
PMCID:
PMC4366500
DOI:
10.1038/ncomms7612
No abstract available
Publication types
Published Erratum