A flexible multi-stimuli in situ (S)TEM: concept, optical performance, and outlook

Felix Börrnert; Heiko Müller; Thomas Riedel; Martin Linck; Angus I Kirkland; Max Haider; Bernd Büchner; Hannes Lichte

doi:10.1016/j.ultramic.2014.11.011

A flexible multi-stimuli in situ (S)TEM: concept, optical performance, and outlook

Ultramicroscopy. 2015 Apr:151:31-36. doi: 10.1016/j.ultramic.2014.11.011. Epub 2014 Nov 21.

Authors

Felix Börrnert¹, Heiko Müller², Thomas Riedel², Martin Linck², Angus I Kirkland³, Max Haider², Bernd Büchner⁴, Hannes Lichte⁵

Affiliations

¹ Speziallabor Triebenberg, Technische Universität Dresden, 01062 Dresden, Germany; IFW Dresden, PF 27 01 16, 01171 Dresden, Germany; Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom. Electronic address: felix.boerrnert@triebenberg.de.
² CEOS GmbH, Englerstraße 28, 69126 Heidelberg, Germany.
³ Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom.
⁴ IFW Dresden, PF 27 01 16, 01171 Dresden, Germany.
⁵ Speziallabor Triebenberg, Technische Universität Dresden, 01062 Dresden, Germany.

PMID: 25624019
DOI: 10.1016/j.ultramic.2014.11.011

Abstract

The progress in (scanning) transmission electron microscopy development had led to an unprecedented knowledge of the microscopic structure of functional materials at the atomic level. Additionally, although not widely used yet, electron holography is capable to map the electric and magnetic potential distributions at the sub-nanometer scale. Nevertheless, in situ studies inside a (scanning) transmission electron microscope ((S)TEM) are extremely challenging because of the much restricted size and accessibility of the sample space. Here, we introduce a concept for a dedicated in situ (S)TEM with a large sample chamber for flexible multi-stimuli experimental setups and report about the electron optical performance of the instrument. We demonstrate a maximum resolving power of about 1 nm in conventional imaging mode and substantially better than 5 nm in scanning mode while providing an effectively usable "pole piece gap" of 70 mm.

Keywords: In situ STEM; In situ TEM; Lorentz STEM; Lorentz TEM.

Publication types

Research Support, Non-U.S. Gov't