Precisely detecting atomic position of atomic intensity images

Zhijun Wang; Yaolin Guo; Sai Tang; Junjie Li; Jincheng Wang; Yaohe Zhou

doi:10.1016/j.ultramic.2014.12.005

Precisely detecting atomic position of atomic intensity images

Ultramicroscopy. 2015 Mar:150:74-78. doi: 10.1016/j.ultramic.2014.12.005. Epub 2014 Dec 16.

Authors

Zhijun Wang¹, Yaolin Guo¹, Sai Tang¹, Junjie Li¹, Jincheng Wang², Yaohe Zhou¹

Affiliations

¹ State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, PR China.
² State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072, PR China. Electronic address: jchwang@nwpu.edu.cn.

PMID: 25544105
DOI: 10.1016/j.ultramic.2014.12.005

Abstract

We proposed a quantitative method to detect atomic position in atomic intensity images from experiments such as high-resolution transmission electron microscopy, atomic force microscopy, and simulation such as phase field crystal modeling. The evaluation of detection accuracy proves the excellent performance of the method. This method provides a chance to precisely determine atomic interactions based on the detected atomic positions from the atomic intensity image, and hence to investigate the related physical, chemical and electrical properties.

Keywords: Atomic intensity image; Atomic position; Strain mapping.

Publication types

Research Support, Non-U.S. Gov't