Shearforce regulated scanning electrochemical microscopy (SECM) has been associated with Raman microspectrometry in order to perform combined electrochemical and spectrochemical analysis on reactive interfaces. The interest of the method was evaluated by analyzing local corrosion phenomena in damaged Zn(Mg, Al) self-healing coatings deposited on steel. Despite the high aspect ratio of the analyzed sample displaying here more than a 50 μm depth profile, the optimized setup allowed (1) precise electrode positioning with the help of shearforce detection, (2) electrochemical measurement at a constant distance from the sample surface, and (3) local chemical analysis of the solid surface by confocal Raman microspectroscopy performed at a constant focal distance from the sample. All in all, this new setup allows one to approach the detailed reactivity involved in defective metal samples.