X-ray imaging for non-destructive microstructure analysis at SSRF

Rongchang Chen; Ping Liu; Tiqiao Xiao; Lisa X Xu

doi:10.1002/adma.201402956

X-ray imaging for non-destructive microstructure analysis at SSRF

Adv Mater. 2014 Dec 10;26(46):7688-91. doi: 10.1002/adma.201402956. Epub 2014 Oct 15.

Authors

Rongchang Chen¹, Ping Liu, Tiqiao Xiao, Lisa X Xu

Affiliation

¹ Shanghai Institute of Applied Physics, Chinese Academy of Science, Shanghai, 201204, China.

PMID: 25319475
DOI: 10.1002/adma.201402956

Abstract

The X-ray imaging beamline at the Shanghai Synchrotron Radiation Facility is aimed at developing and evaluating the effectiveness of synchrotron radiation (SR)-based imaging techniques in planar or computed tomography modalities. Several X-ray imaging methods are in use and find extensive applications in many research fields. In this Essay, the status of the methodology development at the beamline is discussed and applications are reviewed.