Interface recombination current in type II heterostructure bipolar diodes

ACS Appl Mater Interfaces. 2014 Sep 10;6(17):14785-9. doi: 10.1021/am504454g. Epub 2014 Aug 21.

Abstract

Wide-gap semiconductors are often unipolar and can form type II bipolar heterostructures with large band discontinuities. We present such diodes with very high rectification larger than 1 × 10(10). The current is assumed to be entirely due to interface recombination. We derive the ideality factor for both symmetric and asymmetric diodes and find it close to 2 in agreement with experimental data from NiO/ZnO and CuI/ZnO type II diodes. The comparison with experimental results shows that the actual interface recombination rate is orders of magnitude smaller than its possible maximum value.

Keywords: diode; heterostructure; ideality factor; interface recombination; trap; type II band lineup.

Publication types

  • Research Support, Non-U.S. Gov't