Note: Dynamic strain field mapping with synchrotron X-ray digital image correlation

L Lu; D Fan; B X Bie; X X Ran; M L Qi; N Parab; J Z Sun; H J Liao; M C Hudspeth; B Claus; K Fezzaa; T Sun; W Chen; X L Gong; S N Luo

doi:10.1063/1.4887343

Note: Dynamic strain field mapping with synchrotron X-ray digital image correlation

Rev Sci Instrum. 2014 Jul;85(7):076101. doi: 10.1063/1.4887343.

Authors

L Lu¹, D Fan², B X Bie², X X Ran³, M L Qi³, N Parab⁴, J Z Sun⁴, H J Liao⁴, M C Hudspeth⁴, B Claus⁴, K Fezzaa⁵, T Sun⁵, W Chen⁴, X L Gong¹, S N Luo²

Affiliations

¹ CAS Key Laboratory of Mechanical Behavior and Design of Materials, Department of Modern Mechanics, University of Science and Technology of China, Hefei, Anhui 230027, People's Republic of China.
² The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610207, People's Republic of China.
³ School of Science, Wuhan University of Technology, Wuhan, Hubei 430070, People's Republic of China.
⁴ School of Aeronautics and Astronautics, Purdue University, West Lafayette, Indiana 47907, USA.
⁵ Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.

PMID: 25085186
DOI: 10.1063/1.4887343

Abstract

We present a dynamic strain field mapping method based on synchrotron X-ray digital image correlation (XDIC). Synchrotron X-ray sources are advantageous for imaging with exceptional spatial and temporal resolutions, and X-ray speckles can be produced either from surface roughness or internal inhomogeneities. Combining speckled X-ray imaging with DIC allows one to map strain fields with high resolutions. Based on experiments on void growth in Al and deformation of a granular material during Kolsky bar/gas gun loading at the Advanced Photon Source beamline 32ID, we demonstrate the feasibility of dynamic XDIC. XDIC is particularly useful for dynamic, in-volume, measurements on opaque materials under high strain-rate, large, deformation.