Hard X-ray photoelectron spectroscopy of LixNi1-xO epitaxial thin films with a high lithium content

J Chem Phys. 2014 Jul 28;141(4):044718. doi: 10.1063/1.4891366.

Abstract

The core-level and valence-band electronic structures of LixNi1-xO epitaxial thin films with x = 0, 0.27, and 0.48 were studied by hard X-ray photoelectron spectroscopy. A double peak structure, consisting of a main peak and a shoulder peak, and a satellite structure were observed in the Ni 2p3/2 core-level spectra. The intensity ratio of the shoulder to main peak in this double peak structure increased with increasing lithium content in LixNi1-xO. This lithium doping dependence of the Ni 2p3/2 core-level spectra was investigated using an extended cluster model, which included the Zhang-Rice (ZR) doublet bound states arising from a competition between O 2p - Ni 3d hybridization and the Ni on-site Coulomb interaction. The results indicated that the change in the intensity ratio in the main peak is because of a reduction in the ZR doublet bound states from lithium substitutions. This strongly suggests that holes compensating Li doping in LixNi1-xO are of primarily ZR character.