Connecting heterogeneous single slip to diffraction peak evolution in high-energy monochromatic X-ray experiments

Darren C Pagan; Matthew P Miller

doi:10.1107/S1600576714005779

Connecting heterogeneous single slip to diffraction peak evolution in high-energy monochromatic X-ray experiments

J Appl Crystallogr. 2014 May 10;47(Pt 3):887-898. doi: 10.1107/S1600576714005779. eCollection 2014 Jun 1.

Authors

Darren C Pagan¹, Matthew P Miller¹

Affiliation

¹ Sibley School of Mechanical and Aerospace Engineering, Cornell University and Cornell High Energy Synchrotron Source, Ithaca, NY, USA.

Abstract

A forward modeling diffraction framework is introduced and employed to identify slip system activity in high-energy diffraction microscopy (HEDM) experiments. In the framework, diffraction simulations are conducted on virtual mosaic crystals with orientation gradients consistent with Nye's model of heterogeneous single slip. Simulated diffraction peaks are then compared against experimental measurements to identify slip system activity. Simulation results compared against diffraction data measured in situ from a silicon single-crystal specimen plastically deformed under single-slip conditions indicate that slip system activity can be identified during HEDM experiments.

Keywords: high-energy X-rays; modeling; slip system activity; slip systems.