The sequence of phase transitions of crystalline silica has been probed by infrared emission spectroscopy. The lattice dynamics, deeply impacted by the low frequency dynamic disorder, exhibit with increasing temperature signs of inhomogeneous broadening of the symmetry allowed normal modes. High frequency supplementary components are also activated. The analysis with a causal Voigt dielectric function model within the framework of hard mode spectroscopy allowed a fine characterization of solid–solid phase transitions. We also report experimental evidence showing that the occurrence of the intermediate ill-defined region above 1300 K is concomitant with the reactivation of the low frequency dynamic disorder; a behavior change that on the way explains the appearance of the negative thermal expansion regime.