Combining low-energy electron microscopy and scanning probe microscopy techniques for surface science: development of a novel sample-holder

F Cheynis; F Leroy; A Ranguis; B Detailleur; P Bindzi; C Veit; W Bon; P Müller

doi:10.1063/1.4871437

Combining low-energy electron microscopy and scanning probe microscopy techniques for surface science: development of a novel sample-holder

Rev Sci Instrum. 2014 Apr;85(4):043705. doi: 10.1063/1.4871437.

Authors

F Cheynis¹, F Leroy¹, A Ranguis¹, B Detailleur¹, P Bindzi¹, C Veit¹, W Bon¹, P Müller¹

Affiliation

¹ Aix-Marseille Université, CNRS, CINaM UMR 7325, 13288 Marseille, France.

PMID: 24784616
DOI: 10.1063/1.4871437

Abstract

We introduce an experimental facility dedicated to surface science that combines Low-Energy Electron Microscopy/Photo-Electron Emission Microscopy (LEEM/PEEM) and variable-temperature Scanning Probe Microscopy techniques. A technical challenge has been to design a sample-holder that allows to exploit the complementary specifications of both microscopes and to preserve their optimal functionality. Experimental demonstration is reported by characterizing under ultrahigh vacuum with both techniques: Au(111) surface reconstruction and a two-layer thick graphene on 6H-SiC(0001). A set of macros to analyze LEEM/PEEM data extends the capabilities of the setup.