Charge gradient microscopy

Proc Natl Acad Sci U S A. 2014 May 6;111(18):6566-9. doi: 10.1073/pnas.1324178111. Epub 2014 Apr 23.

Abstract

Here we present a simple and fast method to reliably image polarization charges using charge gradient microscopy (CGM). We collected the current from the grounded CGM probe while scanning a periodically poled lithium niobate single crystal and single-crystal LiTaO3 thin film on the Cr electrode. We observed current signals at the domains and domain walls originating from the displacement current and the relocation or removal of surface charges, which enabled us to visualize the ferroelectric domains at a scan frequency above 78 Hz over 10 μm. We envision that CGM can be used in high-speed ferroelectric domain imaging and piezoelectric energy-harvesting devices.

Keywords: atomic force microscopy; charge scraping; piezoresponse; screen charge.

Publication types

  • Research Support, U.S. Gov't, Non-P.H.S.