Continuous-wave terahertz system based on a dual-mode laser for real-time non-contact measurement of thickness and conductivity

Opt Express. 2014 Feb 10;22(3):2259-66. doi: 10.1364/OE.22.002259.

Abstract

Terahertz (THz) waves have been exploited for the non-contact measurements of thickness and refractive index, which has enormous industrial applicability. In this work, we demonstrate a 1.3-μm dual-mode laser (DML)-based continuous-wave THz system for the real-time measurement of a commercial indium-tin-oxide (ITO)-coated glass. The system is compact, cost-effective, and capable of performing broadband measurement within a second at the setting resolution of 1 GHz. The thickness of the glass and the sheet conductivity of the ITO film were successfully measured, and the measurements agree well with those of broadband pulse-based time domain spectroscopy and Hall measurement results.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Conductometry / instrumentation*
  • Electric Conductivity
  • Glass / chemistry*
  • Lasers*
  • Materials Testing / instrumentation*
  • Photometry / instrumentation*
  • Terahertz Radiation*
  • Tin Compounds / analysis
  • Tin Compounds / chemistry*

Substances

  • Tin Compounds
  • indium tin oxide