The direct observation of the domain size and defect distribution in a graphene film is important for the development of electronic applications involving graphene. Here we report a promising method for observing graphene domains grown by chemical vapour deposition. The unavoidable development of crack or pinhole defects during the growth and transfer processes is visualized using a liquid crystal layer. Liquid crystal molecules align anisotropically with respect to the graphene domains and exhibit distinct birefringence properties that can be used to image the graphene domains. This approach is useful for visualizing the crack distributions and their generation process in graphene films under external strain. This type of simple observation method provides an effective route to evaluating the quality and reliability of graphene sheets for use in various electronic devices.