Studying the surface reaction between NiO and Al2O3 via total reflection EXAFS (ReflEXAFS)

J Synchrotron Radiat. 2014 Mar;21(Pt 2):395-400. doi: 10.1107/S1600577513031299. Epub 2014 Jan 10.

Abstract

The reaction between NiO and (0001)- and (1102)-oriented Al2O3 single crystals has been investigated on model experimental systems by using the ReflEXAFS technique. Depth-sensitive information is obtained by collecting data above and below the critical angle for total reflection. A systematic protocol for data analysis, based on the recently developed CARD code, was implemented, and a detailed description of the reactive systems was obtained. In particular, for (1102)-oriented Al2O3, the reaction with NiO is almost complete after heating for 6 h at 1273 K, and an almost uniform layer of spinel is found below a mixed (NiO + spinel) layer at the very upmost part of the sample. In the case of the (0001)-oriented Al2O3, for the same temperature and heating time, the reaction shows a lower advancement degree and a residual fraction of at least 30% NiO is detected in the ReflEXAFS spectra.

Keywords: ReflEXAFS; epitaxy; non-equilibrium compounds; spinel-forming reactions; topochemistry.

Publication types

  • Research Support, Non-U.S. Gov't