A short note on how to convert a conventional analytical TEM into an analytical Low Voltage TEM

M Stöger-Pollach

doi:10.1016/j.ultramic.2014.01.008

A short note on how to convert a conventional analytical TEM into an analytical Low Voltage TEM

Ultramicroscopy. 2014 Oct:145:94-7. doi: 10.1016/j.ultramic.2014.01.008. Epub 2014 Jan 29.

Author

M Stöger-Pollach¹

Affiliation

¹ University Service Center for Transmission Electron Microscopy, Technische Universität Wien, Wiedner Hauptstraße 8-10, A-1040 Wien, Austria. Electronic address: stoeger@ustem.tuwien.ac.at.

PMID: 24529489
DOI: 10.1016/j.ultramic.2014.01.008

Abstract

The present work is a short note on the performance of a conventional transmission electron microscope (TEM) being operated at very low beam energies (below 20keV). We discuss the high tension stability and resolving power of this uncorrected TEM. We find out that the theoretical lens performance can nearly be achieved in practice. We also demonstrate that electron energy loss spectra can be recorded at these low beam energies with standard equipment. The signal-to-noise ratio is sufficiently good for further data treatment like multiple scattering deconvolution and Kramers-Kronig analysis.

Keywords: Electron conversion; Low voltage EELS; Low voltage TEM; Resolution.