A general approach to the structural and analytical characterization of complex bulk oxides that exploits the advantage of the atomic spatial resolution and the analytical capability of aberration-corrected microscopy is described. The combined use of imaging and spectroscopic techniques becomes necessary to the complete characterization of the oxygen-deficient colossal magnetoresistant La(0.56)Sr(0.44)MnO(2.5)-related perovskite. In this compound, the formation of isolated (La/Sr)O and MnO rock-salt-type planar defects are identified from atomically resolved High Angle Annular Dark Field (HAADF) images. The location of the oxygen atomic columns from Annular Bright Field (ABF) images indicates edge-sharing MnO6 octahedra in the MnO planes and the study performed by Electron Energy Loss Spectroscopy (EELS) reveals different Mn oxidation states derived from the corner- or edge-sharing MnO6 octahedra environment.
Keywords: aberration-corrected microscopy; atomic-resolution STEM; colossal magnetoresistant oxides; electron energy loss spectroscopy (EELS); extended defects.
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