Scanning probe image wizard: a toolbox for automated scanning probe microscopy data analysis

Julian Stirling; Richard A J Woolley; Philip Moriarty

doi:10.1063/1.4827076

Scanning probe image wizard: a toolbox for automated scanning probe microscopy data analysis

Rev Sci Instrum. 2013 Nov;84(11):113701. doi: 10.1063/1.4827076.

Authors

Julian Stirling¹, Richard A J Woolley, Philip Moriarty

Affiliation

¹ School of Physics and Astronomy, The University of Nottingham, University Park, Nottingham NG7 2RD, United Kingdom.

PMID: 24289398
DOI: 10.1063/1.4827076

Abstract

We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images with atomic or molecular resolution to improve image visualisation and generate statistical data on surface structure.