Electron-attachment-induced DNA damage: instantaneous strand breaks

J Phys Chem B. 2013 Aug 22;117(33):9669-76. doi: 10.1021/jp406320g. Epub 2013 Aug 7.

Abstract

Low energy electron-attachment-induced damage in DNA, where dissociation channels may involve multiple bonds including complex bond rearrangements and significant nuclear motions, is analyzed here. Quantum mechanics/molecular mechanics (QM/MM) calculations reveal how rearrangements of electron density after vertical electron attachment modulate the position and dynamics of the atomic nuclei in DNA. The nuclear motions involve the elongation of the P-O (P-O(3') and P-O(5')) and C-C (C(3')-C(4') and C(4')-C(5')) bonds for which the acquired kinetic energy becomes high enough so that the neighboring C(3')-O(3') or C(5')-O(5') phosphodiester bond may break almost immediately. Such dynamic behavior should happen on a very short time scale, within 15-30 fs, which is of the same order of magnitude as the time scale predicted for the excess electron to localize around the nucleobases. This result indicates that the C-O phosphodiester bonds can break before electron transfer from the backbone to the base.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • DNA / chemistry*
  • DNA / metabolism
  • DNA Damage*
  • Electrons
  • Models, Molecular
  • Quantum Theory

Substances

  • DNA