A new automatic contact point detection algorithm for AFM force curves

Microsc Res Tech. 2013 Aug;76(8):870-6. doi: 10.1002/jemt.22241. Epub 2013 Jun 3.

Abstract

A new method for estimating the contact point in AFM force curves, based on a local regression algorithm, is presented. The main advantage of this method is that can be easily implemented as a computer algorithm and used for a fully automatic detection of the contact points in the approach force curves on living cells. The estimated contact points have been compared to those obtained by other published methods, which were applied either for materials with an elastic response to indentation forces or for experiments at high loading rates. We have found that the differences in the values of the contact points estimated with three different methods were not statistically significant and thus the algorithm is reliable. Also, we test the convenience of the algorithm for batch-processing by computing the contact points of a force curve map of 625 (25×25) curves.

Keywords: atomic force microscopy; automatic contact point detection; batch processing; force measurements.

Publication types

  • Evaluation Study
  • Research Support, Non-U.S. Gov't

MeSH terms

  • Algorithms
  • Cell Line, Tumor
  • Cells / chemistry
  • Cells / cytology*
  • Humans
  • Microscopy, Atomic Force / methods*
  • Models, Theoretical