Apparatus for measuring the Seebeck coefficients of highly resistive organic semiconducting materials

H Y Cai; D F Cui; Y T Li; X Chen; L L Zhang; J H Sun

doi:10.1063/1.4799968

Apparatus for measuring the Seebeck coefficients of highly resistive organic semiconducting materials

Rev Sci Instrum. 2013 Apr;84(4):044703. doi: 10.1063/1.4799968.

Authors

H Y Cai¹, D F Cui, Y T Li, X Chen, L L Zhang, J H Sun

Affiliation

¹ State Key Laboratory of Transducer Technology, Institute of Electronics, Chinese Academy of Sciences, China. hycai@mail.ie.ac.cn

PMID: 23635216
DOI: 10.1063/1.4799968

Abstract

A Seebeck coefficient measurement apparatus for high resistance organic semiconductor materials has been designed and built. It can measure materials with resistance over 7 × 10(12) Ω. This is the highest material resistance value ever reported for Seebeck coefficient measurement. A cyclic temperature gradient generation technique and a corresponding algorithm are proposed to eliminate the negative effects of the long term drift of Seebeck voltage. Sources of errors in these measurements are discussed.