We present evidence that electromagnetic crosstalk between independent strips in gated x-ray framing cameras can affect relative gains by up to an order of magnitude and gate arrival times up to tens of picoseconds when strip separation times are less then ∼1 ns. Crosstalk is observed by multiple methods, and it is confirmed by direct measurements of voltage on the active surface of the detector and also by indirect voltage monitors in routine operation. The voltage measurements confirm that crosstalk is produced not only in the active regions of the microchannel plate, but also along the entire input path of the voltage pulses.