A simple interferometric polarimeter with an integrated calibration scheme is proposed for accurate and fast mapping of the state of polarization (SOP). Conventional single-shot polarimeters that detect the amplitude and phase of orthogonally polarized field components by interferometry using Fourier fringe analysis suffers from errors caused by the imperfect reference beam and ambiguity in the spatial carrier frequency in the fringe pattern. In the proposed system, the integrated calibration scheme eliminates those error sources and enables accurate measurement of SOP without prior knowledge of the reference beam and the spatial carrier frequency.