Effects of computing parameters and measurement locations on the estimation of 3D NPS in non-stationary MDCT images

Phys Med. 2013 Nov;29(6):684-94. doi: 10.1016/j.ejmp.2012.07.001. Epub 2012 Aug 1.

Abstract

The goal of this study was to investigate the impact of computing parameters and the location of volumes of interest (VOI) on the calculation of 3D noise power spectrum (NPS) in order to determine an optimal set of computing parameters and propose a robust method for evaluating the noise properties of imaging systems. Noise stationarity in noise volumes acquired with a water phantom on a 128-MDCT and a 320-MDCT scanner were analyzed in the spatial domain in order to define locally stationary VOIs. The influence of the computing parameters in the 3D NPS measurement: the sampling distances bx,y,z and the VOI lengths Lx,y,z, the number of VOIs NVOI and the structured noise were investigated to minimize measurement errors. The effect of the VOI locations on the NPS was also investigated. Results showed that the noise (standard deviation) varies more in the r-direction (phantom radius) than z-direction plane. A 25 × 25 × 40 mm(3) VOI associated with DFOV = 200 mm (Lx,y,z = 64, bx,y = 0.391 mm with 512 × 512 matrix) and a first-order detrending method to reduce structured noise led to an accurate NPS estimation. NPS estimated from off centered small VOIs had a directional dependency contrary to NPS obtained from large VOIs located in the center of the volume or from small VOIs located on a concentric circle. This showed that the VOI size and location play a major role in the determination of NPS when images are not stationary. This study emphasizes the need for consistent measurement methods to assess and compare image quality in CT.

Keywords: 3D imaging; CBCT; Computed tomography; Image quality; MDCT; Measurement method; Noise power spectrum; Noise stationarity.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Imaging, Three-Dimensional / instrumentation*
  • Phantoms, Imaging
  • Tomography, X-Ray Computed / instrumentation*