This article introduces a new method for nano-Henry inductance measurements at the frequency of 4.999 MHz with a single quartz crystal oscillating in the switching oscillating circuit. The real novelty of this method, however, lies in a considerable reduction of the temperature influence of AT-cut crystal frequency change in the temperature range between 0 °C and 50 °C through a switching method which compensates for the crystal's natural temperature characteristics. This allows for the compensation of any influences on the crystal such as the compensation of the non-linear temperature characteristics and the ageing of both the crystal and other oscillating circuit elements, as well as the reduction of the output frequency measurement errors with the help of an additional reference frequency. The experimental results show that the switching method greatly improves the measurement of small inductance changes in the range between μH and nH, allowing as a result high-precision measurements (~0.35 fH) in this range.
Keywords: compensation of quartz crystal temperature characteristics; nano-Henry range measurement of small inductance changes; switching oscillating method.