In this paper, we present the application of the T-Matrix method (TMM) for the calculation of Electron Energy Loss Spectra (EELS), cathodoluminescence spectra (CLS) and far-field patterns produced by metallic nano-particles. Being frequently used in electromagnetic scattering calculations, the TMM provides an efficient tool for EELS calculations as well and can be employed, e.g. for the investigation of nano-antennas.
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