We have developed and tested two complementary methods for making time-lapse synchrotron X-ray diffraction (XRD) measurements of the growth of synthetic corrosion layers using a protocol for producing copper(I) chloride (nantokite), on copper as a test. In the first method, a copper coupon was spin-coated with saturated copper(II) chloride solution in air while the surface was characterized in real time using XRD with a fast one-dimensional (1-D) detector. In the second, a droplet of the same reagent was suspended from an X-ray-transparent window in a hermetically sealed cell and the coupon was brought into contact with this while XRD diffractograms were acquired with a charge-coupled device (CCD) camera. The protocol is completed by a deionized water rinse, which was also studied. The XRD shows nantokite precipitation in solution as well as growth on the surface, but the end products were variable proportions of nantokite, cuprite (Cu(2)O), and paratacamite (Cu(2)(OH)(3)Cl). The latter two were observed forming in a reaction between the nantokite and the rinsing water. Comparisons between samples analyzed in the synchrotron and at lower power densities show that the effects of any radiolysis or slight heating of the sample are insignificant in this case. It would be simple to extend these methods to other corrosion or surface reaction systems.