X-ray optics, based on a double-crystal deflection scheme, that enable reflectivity measurements from liquid surfaces/interfaces have been designed, built and commissioned on beamline I07 at Diamond Light Source. This system is able to deflect the beam onto a fixed sample position located at the centre of a five-circle diffractometer. Thus the incident angle can be easily varied without moving the sample, and the reflected beam is tracked either by a moving Pilatus 100K detector mounted on the diffractometer arm or by a stationary Pilatus 2M detector positioned appropriately for small-angle scattering. Thus the system can easily combine measurements of the reflectivity from liquid interfaces (Q(z) > 1 Å(-1)) with off-specular data collection, both in the form of grazing-incidence small-angle X-ray scattering (GISAXS) or wider-angle grazing-incidence X-ray diffraction (GIXD). The device allows operation over the energy range 10-28 keV.