Measurement device for noise factor of microchannel plate

Liu Lei; Huang Zhijian; Pan Tao; Qian Yunsheng

doi:10.1364/AO.51.000883

Measurement device for noise factor of microchannel plate

Appl Opt. 2012 Mar 1;51(7):883-7. doi: 10.1364/AO.51.000883.

Authors

Liu Lei¹, Huang Zhijian, Pan Tao, Qian Yunsheng

Affiliation

¹ Institute of Electronic Engineering and Photoelectric Technology, Nanjing University of Science and Technology, Nanjing 210094, China. liulei442@yahoo.com.cn

PMID: 22410890
DOI: 10.1364/AO.51.000883

Abstract

A new method for noise power factor determination of microchannel plates (MCPs) is described in this paper. The new measuring condition and specific measuring instrument are reported. The system consists of a vacuum chamber, an electron gun, a high-voltage supply, an imaging luminance meter, control units, a signal processing circuit, an A/D converter, a D/A converter, a communication unit, an industrial computer, and measurement software. This measuring method fills a void in measuring technology for the noise factor of MCPs, and it can make a scientific assessment of MCP noise characteristics and provide theoretical direction and technology support for the research and development of high-performance low light level (LLL) devices.