Full-field characterization of a twisted nematic liquid-crystal device using equivalence theorem of a unitary optical system

Chih-Jen Yu; Yao-Teng Tseng; Kuei-Chu Hsu; Chien Chou

doi:10.1364/ao.51.000238

Full-field characterization of a twisted nematic liquid-crystal device using equivalence theorem of a unitary optical system

Appl Opt. 2012 Jan 10;51(2):238-44. doi: 10.1364/ao.51.000238.

Authors

Chih-Jen Yu¹, Yao-Teng Tseng, Kuei-Chu Hsu, Chien Chou

Affiliation

¹ Graduate Institute of Electro-Optical Engineering, Chang Gung University, Taoyuan 333, Taiwan.

PMID: 22270521
DOI: 10.1364/ao.51.000238

Abstract

Based on the equivalence theorem of a unitary optical system, we proposed an analytical approach to characterize the cell parameters of a twisted nematic liquid-crystal device (TNLCD) with full-field resolution. The spatial distribution of three characteristic parameters of a TNLCD was measured by using a polarizer-sample-analyzer imaging polarimeter so that the untwisted phase retardation, cell thickness, and twisted angle of a TNLCD can be directly calculated through the explicit expressions as a function of the characteristic parameters. The measured results agree well with the given values. This method can be implemented for characterization of a TNLCD in the manufacturing process.